Measuring Nano Newton Forces with an Indigenous Atomic Force Microscope

Singha, Achintya and Roy, Anushree and Sonkusare, Anil and Kumar, Pradeep and Kaul, A.D. (2007) Measuring Nano Newton Forces with an Indigenous Atomic Force Microscope. Current Science, 93 (8). pp. 1063-1070. ISSN 0011-3891

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The Atomic Force Microscope (AFM) is a versatile tool in experimental research. The principle of operation of the AFM is based on the measurement of force fields between an atomically sharp tip and surface atoms of metals or insulators. In this note, we demonstrate the ability and limitation of an indigenous AFM, designed and fabricated by us, for various measurements. In particular, short- and long-range interactions between two surfaces, of different geometrical configurations, have been measured and analysed. Our results indicate the reliability of our instrument for measuring forces in the nanonewton scale.

Item Type: Article
Subjects: CSIO > Nano Science and Nano Technology
Depositing User: Ms. J Shrivastav
Date Deposited: 09 Mar 2012 16:47
Last Modified: 11 Apr 2012 12:08

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