Investigation of Tool Life & Surface Roughness During Single Point Diamond Turning of Silicon.

Singh, H.P. and Vaishya, R.O. and Singh, Karanvir and Mishra, Vinod (2013) Investigation of Tool Life & Surface Roughness During Single Point Diamond Turning of Silicon. International Journal of Scientific Research, 2 (6). pp. 265-267. ISSN 2277 - 8179

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Abstract

In the present study investigation was done to analyze the tool life by analyzing the change in surface roughness with time during machining of silicon (infrared crystal) at optimized parameters with a single crystal diamond tool. Silicon has low mass density, low cost & low coefficient of thermal expansion. Due to these properties it is used in microelectro, micro-mechanical & weight sensitive infrared applications where surface roughness is a major criteria for the acceptance of the fabricated part. A contact type mechanical profilometer was used to measure the surface roughness of silicon.

Item Type: Article
Uncontrolled Keywords: tool life, surface roughness, silicon, diamond turning
Subjects: CSIO > Optics
Depositing User: Ms. Jyotsana
Date Deposited: 09 Aug 2018 12:10
Last Modified: 09 Aug 2018 12:10
URI: http://csioir.csio.res.in/id/eprint/532

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