Measurement of Parallelism of Suriaces of a Transparent Sample.

Bhattacharya, J.C. (2001) Measurement of Parallelism of Suriaces of a Transparent Sample. Optics and Lasers in Engineering, 35 (1). pp. 27-31. ISSN 0143-8166

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Official URL: http://www.sciencedirect.com/science/article/pii/S...

Abstract

An interferometric method for the measurement of parallelism of the end faces of a transparent material is described. It is based on the measurement of fringe displacement caused by the wedge angle of the material by using the Lau effect.

Item Type: Article
Uncontrolled Keywords: Parallelism; Lau effect; Interferometry; Gratings; Refractive index; Laser rod; Optics
Subjects: CSIO > Photonics Instrumentation
Depositing User: Ms. J Shrivastav
Date Deposited: 03 Apr 2012 16:15
Last Modified: 03 Apr 2012 16:15
URI: http://csioir.csio.res.in/id/eprint/147

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