Bhattacharya, J.C. (2001) Measurement of Parallelism of Suriaces of a Transparent Sample. Optics and Lasers in Engineering, 35 (1). pp. 27-31. ISSN 0143-8166
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Official URL: http://www.sciencedirect.com/science/article/pii/S...
Abstract
An interferometric method for the measurement of parallelism of the end faces of a transparent material is described. It is based on the measurement of fringe displacement caused by the wedge angle of the material by using the Lau effect.
Item Type: | Article |
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Uncontrolled Keywords: | Parallelism; Lau effect; Interferometry; Gratings; Refractive index; Laser rod; Optics |
Subjects: | CSIO > Photonics Instrumentation |
Depositing User: | Ms. J Shrivastav |
Date Deposited: | 03 Apr 2012 16:15 |
Last Modified: | 03 Apr 2012 16:15 |
URI: | http://csioir.csio.res.in/id/eprint/147 |
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